Dielectric Loss of Thin-Film SiO2 Samples on Al in THz–IR...

Physics of the Solid State 2020 / 2 Vol. 62; Iss. 2

Dielectric Loss of Thin-Film SiO2 Samples on Al in THz–IR Range

Komandin, G. A., Nozdrin, V. S., Pronin, A. A., Porodinkov, O. E., Anzin, V. B., Spektor, I. E.
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Volume:
62
Journal:
Physics of the Solid State
DOI:
10.1134/S1063783420020158
Date:
February, 2020
File:
PDF, 850 KB
2020
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