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[IEEE 2015 IEEE 24th Asian Test Symposium (ATS) - Mumbai (2015.11.22-2015.11.25)] 2015 IEEE 24th Asian Test Symposium (ATS) - Design-for-testability in reversible logic circuits based on bit-swapping
Mondal, Joyati, Das, Debesh K., Bhattacharya, Bhargab B.Year:
2015
DOI:
10.1109/ats.2015.8125669
File:
PDF, 375 KB
2015