A Directed Test Generator for Shared-Memory Verification of...

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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2020

A Directed Test Generator for Shared-Memory Verification of Multicore Chip Designs

Andrade, Gabriel A. G., Graf, Marleson, Pfeifer, Nicolas, dos Santos, Luiz C. V.
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Year:
2020
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/tcad.2020.2974343
File:
PDF, 2.62 MB
2020
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