Investigation of the Thermal Recovery From Reset Breakdown...

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IEEE Transactions on Electron Devices 2020

Investigation of the Thermal Recovery From Reset Breakdown of a SiNₓ-Based RRAM

Hong, Kyungho, Kim, Sungjun, Cho, Seongjae, Park, Byung-Gook, Min, Kyung Kyu, Kim, Min-Hwi, Bang, Suhyun, Kim, Tae-Hyeon, Lee, Dong Keun, Choi, Yeon Joon, Kim, Chae Soo, Lee, Jae Yoon
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Year:
2020
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.2976106
File:
PDF, 411 KB
2020
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