![](/img/cover-not-exists.png)
[IEEE 2019 IEEE 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hangzhou, China (2019.7.2-2019.7.5)] 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) - Increased Fault Isolation Efficiency by Using Scan Cell Visualizer for Scan Chain Failures
Thin Wei, Peter Chua, Loke Sheng, Foo, Choo, Ng Kim, Serrels, Keith A., Ku, Kuyt, Lin, Curt, Chih-yi, TangYear:
2019
DOI:
10.1109/ipfa47161.2019.8984846
File:
PDF, 2.50 MB
2019