A mixed-effects model of two-phase degradation process for reliability assessment and RUL prediction
Wang, Hongyu, Ma, Xiaobing, Zhao, YuVolume:
107
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2020.113622
Date:
April, 2020
File:
PDF, 5.63 MB
2020