Method for the Microwave Measurement of Carrier Lifetime in...

Russian Microelectronics 2005 / 9 Vol. 34; Iss. 5

Method for the Microwave Measurement of Carrier Lifetime in Lightly Doped Silicon Ingots

P. A. Borodovskii, A. F. Buldygin, A. S. Tokarev, E. V. Chernyavskii
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Volume:
34
Language:
english
Pages:
9
DOI:
10.1007/s11180-005-0042-3
Date:
September, 2005
File:
PDF, 95 KB
english, 2005
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