Application of High-Frequency EPR Spectroscopy for the...

Semiconductors 2020 / 1 Vol. 54; Iss. 1

Application of High-Frequency EPR Spectroscopy for the Identification and Separation of Nitrogen and Vanadium Sites in Silicon Carbide Crystals and Heterostructures

Edinach, E. V., Krivoruchko, A. D., Gurin, A. S., Muzafarova, M. V., Ilyin, I. V., Babunts, R. A., Romanov, N. G., Badalyan, A. G., Baranov, P. G.
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Volume:
54
Journal:
Semiconductors
DOI:
10.1134/S1063782620010066
Date:
January, 2020
File:
PDF, 1.02 MB
2020
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