Research and Application of Label Defect Detection Method Based on Machine Vision
Ren, Xiaokang, Wang, Wenqiao, Ren, Jie, Mao, Xuetao, Zhang, MaiVolume:
1453
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/1453/1/012084
Date:
January, 2020
File:
PDF, 704 KB
2020