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[IEEE 2019 IEEE 13th International Conference on ASIC (ASICON) - Chongqing, China (2019.10.29-2019.11.1)] 2019 IEEE 13th International Conference on ASIC (ASICON) - Improve DRAM Leakage Issue During RAS Operational Phase Through TCAD Simulation
Li, Ning, Jiang, Wen-Yang, Wu, Blacksmith, Cao, KanyuYear:
2019
Language:
english
DOI:
10.1109/asicon47005.2019.8983527
File:
PDF, 230 KB
english, 2019