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[IEEE 2019 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2019.12.7-2019.12.11)] 2019 IEEE International Electron Devices Meeting (IEDM) - Metal-oxide based, CMOS-compatible ECRAM for Deep Learning Accelerator
Kim, Seyoung, Ott, John A., Ando, Takashi, Miyazoe, Hiroyuki, Narayanan, Vijay, Rozen, John, Todorov, Teodor, Onen, Murat, Gokmen, Tayfun, Bishop, Douglas, Solomon, Paul, Lee, Ko-Tao, Copel, Matt, FarYear:
2019
Language:
english
DOI:
10.1109/iedm19573.2019.8993463
File:
PDF, 4.91 MB
english, 2019