[IEEE 2019 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2019.10.13-2019.10.17)] 2019 IEEE International Integrated Reliability Workshop (IIRW) - Reliability Engineering Enabling Continued Logic for Memory Device Scaling
O'Sullivan, B. J., Linten, D., Horiguchi, N., Ritzenthaler, R., Litta, E. Dentoni, Simoen, E., Machkaoutsan, V., Fazan, P., Ji, Y. H., Kim, C., Spessot, A.Year:
2019
Language:
english
DOI:
10.1109/iirw47491.2019.8989891
File:
PDF, 2.60 MB
english, 2019