Scan Integrity Tests for EDT Compression

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IEEE Design and Test 2020

Scan Integrity Tests for EDT Compression

Cheng, Wu-Tung, Rajski, Grzegorz Mrugalski Janusz, Trawka, Maciej, Tyszer, Jerzy
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Year:
2020
Language:
english
Journal:
IEEE Design & Test
DOI:
10.1109/mdat.2020.2968271
File:
PDF, 4.41 MB
english, 2020
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