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Measurement and Analysis of SSD Reliability Data Based on Accelerated Endurance Test
Wang, Yufei, Dong, Xiaoshe, Zhang, Xingjun, Wang, LongxiangVolume:
8
Language:
english
Journal:
Electronics
DOI:
10.3390/electronics8111357
Date:
November, 2019
File:
PDF, 2.01 MB
english, 2019