Nano-size defect layers in arsenic-implanted and annealed...

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Applied Nanoscience 2020 / 3

Nano-size defect layers in arsenic-implanted and annealed HgCdTe epitaxial films studied with transmission electron microscopy

Bonchyk, O. Yu., Savytskyy, H. V., Izhnin, I. I., Mynbaev, K. D., Syvorotka, I. I., Korotaev, A. G., Voitsekhovskii, A. V., Fitsych, O. I., Varavin, V. S., Marin, D. V., Mikhailov, N. N., Yakushev, M.
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Language:
english
Journal:
Applied Nanoscience
DOI:
10.1007/s13204-020-01327-9
Date:
March, 2020
File:
PDF, 1.31 MB
english, 2020
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