Study of interfacial random strain fields in core-shell ZnO...

Micron 2020 / 06 Vol. 133

Study of interfacial random strain fields in core-shell ZnO nanowires by scanning transmission electron microscopy

Zhang, Yongsen, Zhang, Wujun, Sun, Yuzhou, Yu, Hongchun, Lu, Jiangbo, Lin, Nan, Wang, Zuyong, Pan, Nan, Wang, Xiaoping, Ma, Chao
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Volume:
133
Language:
english
Journal:
Micron
DOI:
10.1016/j.micron.2020.102862
Date:
June, 2020
File:
PDF, 2.43 MB
english, 2020
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