Nonlinear process quality prediction using wavelet denoising OSC-SVM-PLS
yang, fan, li, xiang, bai, jianjun, Zhang, Ridong, Gao, FurongLanguage:
english
Journal:
Industrial & Engineering Chemistry Research
DOI:
10.1021/acs.iecr.0c00224
Date:
March, 2020
File:
PDF, 734 KB
english, 2020