Using resonant energy X-ray diffraction to extract chemical order parameters in ternary semiconductors
Schnepf, Rekha R., Levy-Wendt, Ben L., Tellekamp, M. Brooks, Ortiz, Brenden R., Melamed, Celeste L., Schelhas, Laura T., Stone, Kevin H., Toney, Michael F., Toberer, Eric S., Tamboli, Adele C.Year:
2020
Language:
english
Journal:
Journal of Materials Chemistry C
DOI:
10.1039/C9TC06699C
File:
PDF, 3.27 MB
english, 2020