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[IEEE 2019 31st International Conference on Microelectronics (ICM) - Cairo, Egypt (2019.12.15-2019.12.18)] 2019 31st International Conference on Microelectronics (ICM) - Parallel Deep CNN Structure for Glioma Detection and Classification via Brain MRI Images
Abd-Ellah, Mahmoud Khaled, Awad, Ali Ismail, Hamed, Hesham F. A., Khalaf, Ashraf A. M.Year:
2019
Language:
english
DOI:
10.1109/ICM48031.2019.9021872
File:
PDF, 4.32 MB
english, 2019