![](/img/cover-not-exists.png)
[IEEE 2019 IEEE 37th VLSI Test Symposium (VTS) - Monterey, CA, USA (2019.4.23-2019.4.25)] 2019 IEEE 37th VLSI Test Symposium (VTS) - Innovate Practices on CyberSecurity of Hardware Semiconductor Devices
Crouch, Alfred L., Levin, Peter, Dworak, Jennifer, Ramakrishnan, Lakshmi, Xia, Yuhe, Zhang, Chi, Engels, Daniel, Evans, Gary, Gui, Ping, McWilliams, Scott, Gupta, Saurabh, Stellari, Franco, Wang, NaigYear:
2019
Language:
english
DOI:
10.1109/VTS.2019.8758665
File:
PDF, 7.60 MB
english, 2019