[IEEE 2019 International Conference on Technologies and Applications of Artiï¬cial Intelligence (TAAI) - Kaohsiung, Taiwan (2019.11.21-2019.11.23)] 2019 International Conference on Technologies and Applications of Artiï¬cial Intelligence (TAAI) - Statistical Multiframes Accuracy Methodology For Attendance Marking System
Lee, Kuan Heng, Addicam, Sanjay V, Krylov, Ilya, Nosov, Sergei, Lai, Mee Sim, Lee, Zhan Qiang, Chai, Chung ShienYear:
2019
Language:
english
DOI:
10.1109/taai48200.2019.8959936
File:
PDF, 947 KB
english, 2019