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[IEEE 2019 IEEE International Ultrasonics Symposium (IUS) - Glasgow, United Kingdom (2019.10.6-2019.10.9)] 2019 IEEE International Ultrasonics Symposium (IUS) - Removing frequency dependent aberrations in acoustic microscopy
Tommiska, Oskari, Merilainen, Antti, Makinen, Joni, Hyvonen, Jere, Salmi, Ari, Haggstrom, EdwardYear:
2019
Language:
english
DOI:
10.1109/ultsym.2019.8925779
File:
PDF, 2.41 MB
english, 2019