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[IEEE 2019 2nd World Conference on Mechanical Engineering and Intelligent Manufacturing (WCMEIM) - Shanghai, China (2019.11.22-2019.11.24)] 2019 2nd World Conference on Mechanical Engineering and Intelligent Manufacturing (WCMEIM) - Tomato Processing Defect Detection Using Deep Learning
Shi, Xunang, Wu, XunchengYear:
2019
Language:
english
DOI:
10.1109/wcmeim48965.2019.00153
File:
PDF, 9.43 MB
english, 2019