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[IEEE 2019 IEEE 5th International Conference for Convergence in Technology (I2CT) - Bombay, India (2019.3.29-2019.3.31)] 2019 IEEE 5th International Conference for Convergence in Technology (I2CT) - Automated Testing of Faults of an Automotive System

Varshney, Akanksha, Joshi, Sanjay, Namrata, K.
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Year:
2019
Language:
english
DOI:
10.1109/I2CT45611.2019.9033751
File:
PDF, 10.82 MB
english, 2019
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