[IEEE 2019 IEEE AUTOTESTCON - National Harbor, MD, USA (2019.8.26-2019.8.29)] 2019 IEEE AUTOTESTCON - Solid State Switching Miniaturizes Complex Avionics Chassis Testing to Solve Intermittent Faults and the Occurrence of Re-Test Okay Events
Martin, Peter, Ferguson, C. Alan, Teal, ChristopherYear:
2019
Language:
english
DOI:
10.1109/autotestcon43700.2019.8961899
File:
PDF, 4.11 MB
english, 2019