[IEEE 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) - Beijing, China (2018.5.16-2018.5.18)] 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) - Radiation Hardness Design and Test Verification of Program Configuration Module Based on Commercial Device
Sun, Yi, Wei, Zhichao, Bo, Mei, Luo, Lei, Yu, Qing-Kui, Tang, MinYear:
2018
Language:
english
DOI:
10.1109/icreed.2018.8905087
File:
PDF, 315 KB
english, 2018