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[IEEE 2019 IEEE 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hangzhou, China (2019.7.2-2019.7.5)] 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) - Practical Dynamic Laser Stimulation Technique and Code Modification: A Soft Defect Localization Approach for Microcontroller Self-Test Failures
Cala, Kevin Joshua S., Saludares, Junald C., Basbas, Wendel A.Year:
2019
Language:
english
DOI:
10.1109/ipfa47161.2019.8984852
File:
PDF, 4.35 MB
english, 2019