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[IEEE 2019 IEEE International Test Conference (ITC) - Washington, DC, USA (2019.11.9-2019.11.15)] 2019 IEEE International Test Conference (ITC) - A Jitter Injection Module for Production Test of 52-Gbps PAM4 Signal Interfaces
Ichiyama, Kiyotaka, Kusaka, Takashi, Ishida, MasahiroYear:
2019
Language:
english
DOI:
10.1109/itc44170.2019.9000138
File:
PDF, 3.05 MB
english, 2019