Single-Event Upset Responses of Metal-Oxide-Metal...

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IEEE Transactions on Nuclear Science 2020

Single-Event Upset Responses of Metal-Oxide-Metal Capacitors and Diodes Used in Bulk 65nm CMOS Analog Circuits

Xu, Rui, Kinget, Peter, Parsons, John, Andeen, Timothy, Hsu, Chen-kai, Kalani, Sarthak, Ban, Jaroslav, Wang, Qiang, Ochoa, Ines, Burton, Charles, Unal, Mesut, Sun, Nan
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Year:
2020
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2020.2974229
File:
PDF, 3.67 MB
english, 2020
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