[IEEE 2019 IEEE 5th International Conference for Convergence in Technology (I2CT) - Bombay, India (2019.3.29-2019.3.31)] 2019 IEEE 5th International Conference for Convergence in Technology (I2CT) - Crop Yield Prediction using Machine Learning Techniques
Medar, Ramesh, Rajpurohit, Vijay S., Shweta, ShwetaYear:
2019
Language:
english
DOI:
10.1109/I2CT45611.2019.9033611
File:
PDF, 2.27 MB
english, 2019