Bias Stress Instability in Multilayered MoS₂ Field-Effect...

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IEEE Transactions on Electron Devices 2020

Bias Stress Instability in Multilayered MoS₂ Field-Effect Transistors Under Pulse-Mode Operation

Seo, Seung Gi, Joeng, Jinheon, Kim, Kwangtaek, Kim, Kyuwon, Jin, Sung Hun
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Year:
2020
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.2975623
File:
PDF, 2.92 MB
english, 2020
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