Temperature-dependent study of slow traps generation...

Solid-State Electronics 2020 / 05 Vol. 167

Temperature-dependent study of slow traps generation mechanism in HfO2/GeON/Ge(1 1 0) metal oxide semiconductor devices

Agrawal, Khushabu, Patil, Vilas, Barhate, Viral, Yoon, Geonju, Lee, Youn-Jung, Mahajan, Ashok, Yi, Junsin
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
167
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2020.107797
Date:
May, 2020
File:
PDF, 3.68 MB
english, 2020
Conversion to is in progress
Conversion to is failed