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[IEEE 2019 4th International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT) - Bangalore, India (2019.5.17-2019.5.18)] 2019 4th International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT) - Fast BIST Mechanism for Faster Validation of Memory Array
Bagewadi, Shrinidhi N, Shadab, Syed, Roopa, JYear:
2019
Language:
english
DOI:
10.1109/RTEICT46194.2019.9016882
File:
PDF, 5.44 MB
english, 2019