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[IEEE 2019 IEEE 13th International Conference on ASIC (ASICON) - Chongqing, China (2019.10.29-2019.11.1)] 2019 IEEE 13th International Conference on ASIC (ASICON) - High-Resolution Low-Sampling-Rate Îâ ADC Linearity Short-Time Testing Algorithm
Wei, Jiang-Lin, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu, Kushita, Nene, Arai, Takahiro, Sha, Lei, Kuwana, Anna, Kobayashi, Haruo, Nakatani, Takayuki, Hatayama, Kazumi, Sato, KenoYear:
2019
Language:
english
DOI:
10.1109/asicon47005.2019.8983555
File:
PDF, 1.58 MB
english, 2019