[IEEE 2019 IEEE Radiation Effects Data Workshop (IEEE) (in conjunction with NSREC 2019) - San Antonio, TX, USA (2019.7.8-2019.7.12)] 2019 IEEE Radiation Effects Data Workshop - Laser-Induced Micro SEL Characterization of SRAM Devices
Yingqi, Ma, Jianwei, Han, Shipeng, Shangguan, Xiang, Zhu, Rui, ChenYear:
2019
Language:
english
DOI:
10.1109/redw.2019.8906568
File:
PDF, 8.86 MB
english, 2019