Measurement of the optical dielectric properties of...

Results in Physics 2020 / 03 Vol. 16

Measurement of the optical dielectric properties of thin-film materials by ultrafast time-resolved interferometry

Song, Hai-Ying, Wang, Peng, Ge, Qi-Ni, Li, Ya-Chao, Emara, Elshaimaa M., Lu, Mei-Rong, Liu, Shi-Bing
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Volume:
16
Language:
english
Journal:
Results in Physics
DOI:
10.1016/j.rinp.2020.102958
Date:
March, 2020
File:
PDF, 1.27 MB
english, 2020
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