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[IEEE 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - St. Petersburg and Moscow, Russia (2020.1.27-2020.1.30)] 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - The Normally-On 100-nm pHEMT and mHEMT Transistors Electrophysical Properties Simulation Study
Kyaw, Than Phyo, Egorkin, Vladimir, Korneev, Victor, Thant, Myo MinYear:
2020
Language:
english
DOI:
10.1109/EIConRus49466.2020.9039278
File:
PDF, 17.79 MB
english, 2020