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[IEEE 2020 IEEE 2nd International Workshop on Intelligent Bug Fixing (IBF) - London, ON, Canada (2020.2.18-2020.2.18)] 2020 IEEE 2nd International Workshop on Intelligent Bug Fixing (IBF) - An Empirical Study of High-Impact Factors for Machine Learning-Based Vulnerability Detection
Zheng, Wei, Gao, Jialiang, Wu, Xiaoxue, Xun, Yuxing, Liu, Guoliang, Chen, XiangYear:
2020
Language:
english
DOI:
10.1109/IBF50092.2020.9034888
File:
PDF, 1.43 MB
english, 2020