Analysis of the Impact of Process Variations and Manufacturing Defects on the Performance of Carbon-Nanotube FETs
Banerjee, Sanmitra, Chaudhuri, Arjun, Chakrabarty, KrishnenduYear:
2020
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2020.2976734
File:
PDF, 685 KB
english, 2020