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Effect of the High-Temperature Off-State Stresses on the Degradation of AlGaN/GaN HEMTs
Lin, Jinfu, Liu, Hongxia, Wang, Shulong, Liu, Chang, Li, Mengyu, Wu, LeiVolume:
8
Language:
english
Journal:
Electronics
DOI:
10.3390/electronics8111339
Date:
November, 2019
File:
PDF, 1.26 MB
english, 2019