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[IEEE 2019 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2019.12.7-2019.12.11)] 2019 IEEE International Electron Devices Meeting (IEDM) - Memory-Logic Hybrid Gate with 3D-Stackable Complementary Latches for FinFET-based Neural Networks
Lee, Chieh, Chih, Yue-Der, Chang, Jonathan, Lin, Chrong Jung, King, Ya-ChinYear:
2019
Language:
english
DOI:
10.1109/iedm19573.2019.8993511
File:
PDF, 742 KB
english, 2019