(Invited) A Novel Optical Characterization of...

ECS Transactions 2019 / 07 Vol. 92; Iss. 9

(Invited) A Novel Optical Characterization of a-Si:H/c-Si Interface Microstructures Based on Data of Positron Annihilation Spectroscopy

Matsuki, Nobuyuki, Matsui, Takuya, Michishio, Koji, O' Rourke, Brian, Oshima, Nagayasu, Uedono, Akira
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Volume:
92
Language:
english
Journal:
ECS Transactions
DOI:
10.1149/09209.0021ecst
Date:
July, 2019
File:
PDF, 412 KB
english, 2019
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