![](/img/cover-not-exists.png)
X-ray interaction characteristic functions in semiconductor detectors
Kim, Jinwoo, Tanguay, Jesse, Cunningham, Ian A., Kim, Ho KyungVolume:
15
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/15/03/C03029
Date:
March, 2020
File:
PDF, 1.36 MB
english, 2020