[IEEE 2019 IEEE 4th International Future Energy Electronics Conference (IFEEC) - Singapore, Singapore (2019.11.25-2019.11.28)] 2019 IEEE 4th International Future Energy Electronics Conference (IFEEC) - Phase Error Analysis of Phase-locked Loop under Voltage Perturbation
HOU, Chuanchuan, ZHU, Miao, LI, Zhengzhao, CAI, XuYear:
2019
Language:
english
DOI:
10.1109/IFEEC47410.2019.9015008
File:
PDF, 3.19 MB
english, 2019