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[IEEE 2019 31st International Conference on Microelectronics (ICM) - Cairo, Egypt (2019.12.15-2019.12.18)] 2019 31st International Conference on Microelectronics (ICM) - A Very Deep Transfer Learning Model for Vehicle Damage Detection and Localization

Dhieb, Najmeddine, Ghazzai, Hakim, Besbes, Hichem, Massoud, Yehia
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Year:
2019
Language:
english
DOI:
10.1109/icm48031.2019.9021687
File:
PDF, 405 KB
english, 2019
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