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Impacts of extra charges on trap level modulations at cSi/aSiO2 interface: correlations to leakage current recovery in oxide dielectric
Ma, Xiaolei, Wang, Fei, Wei, Wei, Wu, Jixuan, Zhan, Xuepeng, Li, Yuan, Chen, JiezhiLanguage:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/1361-6463/ab8035
Date:
March, 2020
File:
PDF, 3.01 MB
english, 2020