[IEEE 2019 IEEE Asia-Pacific Microwave Conference (APMC) - Singapore, Singapore (2019.12.10-2019.12.13)] 2019 IEEE Asia-Pacific Microwave Conference (APMC) - Breakdown voltage analysis of Dual-Gate MISHEMT: TCAD based assessment
Singh, Preeti, Kumari, Vandana, Saxena, Manoj, Gupta, MridulaYear:
2019
Language:
english
DOI:
10.1109/APMC46564.2019.9038776
File:
PDF, 8.67 MB
english, 2019