Stretching AEM near-surface resolution limits related to low- and very high resistivity contrasts
Skurdal, G. H., Pfaffhuber, A. A., Davis, A., Bazin, S., Anschutz, H., Nyboe, N. S., Foged, N., Thomassen, T., Wiig, T.Volume:
2018
Language:
english
Journal:
ASEG Extended Abstracts
DOI:
10.1071/aseg2018abw8_4g
Date:
December, 2018
File:
PDF, 1.34 MB
english, 2018