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[IEEE 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - St. Petersburg and Moscow, Russia (2020.1.27-2020.1.30)] 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - Mechanical Stresses Analysis of Thin Round Membranes in the Case of Large Deflections
Dedkova, Anna A., Yu. Glagolev, Petr, Demin, Gleb D., Gusev, Evgeney E., Skvortsov, Pavel A.Year:
2020
Language:
english
DOI:
10.1109/EIConRus49466.2020.9039289
File:
PDF, 372 KB
english, 2020