[IEEE 2019 18th IEEE International Conference On Machine Learning And Applications (ICMLA) - Boca Raton, FL, USA (2019.12.16-2019.12.19)] 2019 18th IEEE International Conference On Machine Learning And Applications (ICMLA) - Weakly Supervised Deep Learning for Detecting and Counting Dead Cells in Microscopy Images
Chen, Siteng, Li, Ao, Lasick, Kathleen, Huynh, Julie, Powers, Linda, Roveda, Janet, Paek, AndrewYear:
2019
Language:
english
DOI:
10.1109/icmla.2019.00282
File:
PDF, 374 KB
english, 2019